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Image contrast of dislocations and atomic steps on (111) silicon surface in reflection electron microscopy

✍ Scribed by Nobuyuki Osakabe; Yasumasa Tanishiro; Katsumichi Yagi; Goro Honjo

Publisher: Elsevier Science
Year: 1981
Weight: 61 KB
Volume: 102
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(81)90396-0

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