On the vacancy formation and diffusion on the Si(111)7×7 surfaces under exposures of low oxygen pressure studied by in Situ reflection electron microscopy

✍ Scribed by N. Shimizu; Y. Tanishiro; K. Takayanagi; K. Yagi

• Publisher: Elsevier Science
• Year: 1987
• Weight: 47 KB
• Volume: 191
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(87)90897-8