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Investigation of structural defects in polycrystalline silicon by electron microscopy

✍ Scribed by Dr. S. S. Gorelik; Dr. Z. A. Zarifyants; Prof. L. S. Milevskii; Dr. T. B. Sagalova

Publisher: John Wiley and Sons
Year: 1981
Tongue: English
Weight: 221 KB
Volume: 16
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.19810160222

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