High resolution electron microscopy investigations of interface and other structure defects in some ceramics

✍ Scribed by Wen, Shulin; Liu, Qian

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 519 KB
• Volume: 40
• Category: Article
• ISSN: 1059-910X
• DOI: 10.1002/(sici)1097-0029(19980201)40:3<177::aid-jemt2>3.0.co;2-s

✦ Synopsis

Interface, grain boundary, and other structure defects are the most important structural factors to affect the properties of ceramics materials. The present paper shows the relationship between the properties and those structure features such as grain boundaries, phase boundaries, interfaces, twins, intergrowths, dislocations, point defect aggregates, order-disorder, and other structure defects in different kinds of ceramics materials. At present this research covers: C 60 , sialon-based ceramics (␣-sialon/SiC(w) composite, Y-␣-sialon/␤-sialon composite), high Tc superconductors (YBa