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Analysis of rod-like defects in silicon and germanium by means of high-resolution electron microscopy

✍ Scribed by Pasemann, M. ;Hoehl, D. ;Aseev, A. L. ;Pchelyakov, O. P.

Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
934 KB
Volume
80
Category
Article
ISSN
0031-8965

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