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Direct observation of crystallization in silicon by in situ high-resolution electron microscopy

✍ Scribed by R. Sinclair; J. Morgiel; A.S. Kirtikar; I.-W. Wu; A. Chiang

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
727 KB
Volume
51
Category
Article
ISSN
0304-3991

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