✦ LIBER ✦

Polarographic determination of metallic impurities on lapped silicon wafers

✍ Scribed by Pier Luigi Buldini; Alessandro Toponi; Quintilio Zini

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of metal impurities in

✍ L. Frey; F. Kroninger; N. Streckfusse; H. Ryssel; J. Margail 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 297 KB

Application of capillary zone electropho

✍ J. Boden; K. Bächmann; L. Kotz; L. Fabry; S. Pahlke 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 629 KB

Infrared lensless holographic microscope

✍ L. Repetto; R. Chittofrati; E. Piano; C. Pontiggia 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 203 KB

Determination of thickness and refractiv

✍ W. Lukosz; P. Pliska 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 263 KB

Determination of thickness, refractive i

✍ W. Lukosz; P. Pliska 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 666 KB

Determination of lighter impurities on s

✍ R.L. Meek; W.M. Gibson 📂 Article 📅 1972 🏛 Elsevier Science ⚖ 193 KB