✦ LIBER ✦

Determination of thickness, refractive indices, optical anisotropy of, and stresses in SiO2 films on silicon wafers

✍ Scribed by W. Lukosz; P. Pliska

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of thickness and refractiv

✍ W. Lukosz; P. Pliska 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 263 KB

Optical thickness measurement of SiO2–Si

📂 Article 📅 1967 🏛 Elsevier Science 🌐 English ⚖ 105 KB

Determination of the thickness and refra

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 105 KB