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Determination of thickness and refractive index of SiO2 films on silicon wafers using an Abbe refractometer

✍ Scribed by W. Lukosz; P. Pliska

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of thickness, refractive i

✍ W. Lukosz; P. Pliska 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 666 KB

Refractive index and thickness determina

✍ M. Abraham 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 620 KB

Transmission interference spectrometric

✍ G.F. Pastore 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 447 KB

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📂 Article 📅 1965 🏛 Elsevier Science 🌐 English ⚖ 143 KB

Determination of thickness and refractiv

📂 Article 📅 1965 🏛 Elsevier Science 🌐 English ⚖ 93 KB

Usefulness of the polarimetric method fo

📂 Article 📅 1954 🏛 Elsevier Science 🌐 English ⚖ 105 KB