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Physico-chemical processes in metal–oxide–semiconductor transistors with thick gate oxide during high electric field stress

✍ Scribed by Goran S. Ristić; Momčilo M. Pejović; Aleksandar B. Jakšić

Book ID: 116669821
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 389 KB
Volume: 353
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2006.09.020

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