✦ LIBER ✦
Observations in trapping characteristics of positive bias temperature instability on high-k/metal gate n-type metal oxide semiconductor field effect transistor with the complementary multi-pulse technique
✍ Scribed by J.C. Liao; Y.K. Fang; Y.T. Hou; W.H. Wu; C.L. Hung; P.F. Hsu; K.C. Lin; K.T. Huang; T.L. Lee; M.S. Liang
- Book ID
- 108290025
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 493 KB
- Volume
- 516
- Category
- Article
- ISSN
- 0040-6090
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