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Photoelectron spectroscopic investigations of thin FexSi100−x films

✍ Scribed by R. Kilper; St. Teichert; Th. Franke; P. Häussler; H.-G. Boyen; A. Cossy-Favre; P. Oelhafen

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
321 KB
Volume
91
Category
Article
ISSN
0169-4332

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