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X-ray photoelectron spectroscopic studies of electrodeposited mercury cadmium telluride semiconductor thin films

✍ Scribed by R Kumaresan; R Gopalakrishnan; S Moorthy Babu; P Ramasamy; D Kruger; P Zaumseil

Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
295 KB
Volume
61
Category
Article
ISSN
0022-3697

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✦ Synopsis

Mercury cadmium telluride (MCT) polycrystalline thin films were grown by electrodeposition technique, at varying conditions. The X-ray photoelectron spectroscopic (XPS) studies have been carried out on MCT thin films to analyze the quality and nature of the films. The various elements present and the surface contamination in electrodeposited MCT films were identified. The chemical states of the various elements present were studied and their quantification was also carried out. The deposition conditions were identified for growing the MCT films of specific compositions.

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X-ray photoelectron spectroscopic studie
X-ray photoelectron spectroscopic studies of thin film oxides of cobalt and molybdenum
✍ N. S. McIntyre; D. D. Johnston; L. L. Coatsworth; R. D. Davidson; J. R. Brown πŸ“‚ Article πŸ“… 1990 πŸ› John Wiley and Sons 🌐 English βš– 607 KB

## Abstract Surface oxidation reactions of cobalt, molybdenum and mixed cobalt–molybdenum metals have been investigated using x‐ray photoelectron spectroscopy (XPS). The oxide stoichiometries have been determined from XPS intensity measurements. Such quantification has been important in identifying