X-ray photoelectron spectroscopic studies of thin film oxides of cobalt and molybdenum
β Scribed by N. S. McIntyre; D. D. Johnston; L. L. Coatsworth; R. D. Davidson; J. R. Brown
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 607 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0142-2421
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β¦ Synopsis
Abstract
Surface oxidation reactions of cobalt, molybdenum and mixed cobaltβmolybdenum metals have been investigated using xβray photoelectron spectroscopy (XPS). The oxide stoichiometries have been determined from XPS intensity measurements. Such quantification has been important in identifying oxide compositions with characteristic XPS spectra. A number of discrete binary molybdenum oxides have been characterized after reactions at 200Β°C and pressures ranging from 1 atm to 10^β6^ Pa. At the lowest pressure, the Mo 3d spectra and O/Mo ratios suggest the formation of a molybdenumβoxygen structure with a stoichiometry near unity. By contrast, at higher pressures, oxides that are predominantly MoO~2~ and MoO~3~ appear, but other intermediate oxide structures are also identified. Wellβdefined binary oxides of cobalt can be prepared from cobalt metal after heating in oxygen at different pressures. New binary oxides of cobalt and molybdenum have been generated by the reaction on MoO~3~ or Co~3~O~4~ substrates. Oxidation of a thin film of molybdenum on a Co~3~O~4~ substrate has been shown to produce a nearly stoichiometric surface layer of CoMoO~4~. The procedure could be useful for the production of other ternary oxides of possible interest for use as XPS reference materials.
π SIMILAR VOLUMES
Mercury cadmium telluride (MCT) polycrystalline thin films were grown by electrodeposition technique, at varying conditions. The X-ray photoelectron spectroscopic (XPS) studies have been carried out on MCT thin films to analyze the quality and nature of the films. The various elements present and th