✦ LIBER ✦

Performance and Vdd scaling in deep submicrometer CMOS

✍ Scribed by Kai Chen; Chenming Hu

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Transistor Mismatch Properties in Deep-S

✍ Xiaobin Yuan; Shimizu, T.; Mahalingam, U.; Brown, J.S.; Habib, K.Z.; Tekleab, D. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 722 KB

The effect of high-K gate dielectrics on

✍ Mohapatra, N.R.; Desai, M.P.; Narendra, S.G.; Rao, V.R. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 276 KB

The challenge of signal integrity in dee

✍ Caignet, F.; Delmas-Bendhia, S.; Sicard, E. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 830 KB

RF circuit performance degradation due t

✍ Qiang Li; Jinlong Zhang; Wei Li; Yuan, J.S.; Yuan Chen; Oates, A.S. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 147 KB

Leakage scaling in deep submicron CMOS f

✍ Yo-Sheng Lin; Chung-Cheng Wu; Chih-Sheng Chang; Rong-Ping Yang; Wei-Ming Chen; J 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 347 KB

STI-Bounded Single-Photon Avalanche Diod

✍ Finkelstein, H.; Hsu, M.J.; Esener, S.C. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 224 KB