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The effect of high-K gate dielectrics on deep submicrometer CMOS device and circuit performance

โœ Scribed by Mohapatra, N.R.; Desai, M.P.; Narendra, S.G.; Rao, V.R.


Book ID
114539074
Publisher
IEEE
Year
2002
Tongue
English
Weight
276 KB
Volume
49
Category
Article
ISSN
0018-9383

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