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The challenge of signal integrity in deep-submicrometer CMOS technology

✍ Scribed by Caignet, F.; Delmas-Bendhia, S.; Sicard, E.

Book ID: 119782099
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 830 KB
Volume: 89
Category: Article
ISSN: 0018-9219
DOI: 10.1109/5.920583

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