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Leakage scaling in deep submicron CMOS for SoC

✍ Scribed by Yo-Sheng Lin; Chung-Cheng Wu; Chih-Sheng Chang; Rong-Ping Yang; Wei-Ming Chen; Jhon-Jhy Liaw; Diaz, C.H.

Book ID: 114616741
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 347 KB
Volume: 49
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2002.1003727

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