The ideal ion-milled transmission electron microscope (TEM) sample would contain large, thin areas in selected regions, minimal top and bottom surface amorphization, and minimal preferential etching of adjacent materials. This desire has led to studies of these effects and improvements in designs an
Optimized Ar+-ion milling procedure for TEM cross-section sample preparation
✍ Scribed by Levin Dieterle; Benjamin Butz; Erich Müller
- Book ID
- 113940553
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 948 KB
- Volume
- 111
- Category
- Article
- ISSN
- 0304-3991
No coin nor oath required. For personal study only.
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