𝔖 Bobbio Scriptorium
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TEM cross-section preparation with minimal ion milling time

✍ Scribed by C. P. SCOTT; A. J. CRAVEN; P. HATTO; C. DAVIES

Book ID
114427890
Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
465 KB
Volume
182
Category
Article
ISSN
0022-2720

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πŸ“œ SIMILAR VOLUMES

Preparation of cross-sectional TEM sampl
Preparation of cross-sectional TEM samples for low-angle ion milling
✍ McCaffrey, J.P.; Barna, A. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 177 KB πŸ‘ 2 views

The ideal ion-milled transmission electron microscope (TEM) sample would contain large, thin areas in selected regions, minimal top and bottom surface amorphization, and minimal preferential etching of adjacent materials. This desire has led to studies of these effects and improvements in designs an