✦ LIBER ✦

On oxide—nitride interface traps by thermal oxidation of thin nitride in metal-oxide-nitride-oxide-semiconductor memory structures

✍ Scribed by Suzuki, E.; Hayashi, Y.

Book ID: 114595495
Publisher: IEEE
Year: 1986
Tongue: English
Weight: 410 KB
Volume: 33
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1986.22468

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