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Traps created at the interface between the nitride and the oxide on the nitride by thermal oxidation

✍ Scribed by Suzuki, Eiichi

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of the silicon nitride–

✍ V.A. Gritsenko; S.N. Svitasheva; I.P. Petrenko; Yu.N. Novikov; Yu.N. Morokov; He 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 330 KB

Chemical interactions at the interface b

✍ F. Malengreau; V. Hautier; M. Vermeersch; R. Sporken; R. Caudano 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 745 KB

On the Oxidation and Nitridation of Chro

✍ Laurent Royer; Xavier Ledoux; Stéphane Mathieu; Pierre Steinmetz 📂 Article 📅 2010 🏛 Springer-Verlag 🌐 English ⚖ 577 KB

Photon-induced generation of interface s

✍ Edmund P. Burte 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 681 KB

Observations on the oxidation and nitrid

✍ R.E. Lawn; F.G. Wilson; C.D. Desforges 📂 Article 📅 1978 🏛 Elsevier Science ⚖ 390 KB

Recombination at the interface between s

✍ Kerr, Mark J; Cuevas, Andres 📂 Article 📅 2002 🏛 Institute of Physics 🌐 English ⚖ 242 KB