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Degradation properties in metal-nitride-oxide-semiconductor structures

✍ Scribed by Suzuki, Eiichi

Book ID: 121493748
Publisher: American Institute of Physics
Year: 1981
Tongue: English
Weight: 768 KB
Volume: 52
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.328581

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