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Electrical properties of 1 MeV helium implanted metal- oxide-semiconductor structures

✍ Scribed by Fahrner, W. R. ;Schneider, C. P. ;Gorey, E. F.


Book ID
105379171
Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
530 KB
Volume
95
Category
Article
ISSN
0031-8965

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