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Observation of Si out-diffusion related defects in SiC growth on Si(001)

✍ Scribed by M. Diani; A. Mesli; L. Kubler; A. Claverie; J.L. Balladore; D. Aubel; S. Peyre; T. Heiser; J.L. Bischoff

No coin nor oath required. For personal study only.

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