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Observation of defects and growth orientations of YBa2Cu3Ox thin films with YSZ buffer layers on Si

✍ Scribed by Doo-Sup Hwang; Soon-Gul Lee; Yong-Ki Park; John-S Chun; Jong-Chul Park

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 486 KB
Volume: 250
Category: Article
ISSN: 0921-4534
DOI: 10.1016/0921-4534(95)00331-2

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