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Nanoscratch Characterization of GaN Epilayers on c- and a-Axis Sapphire Substrates

✍ Scribed by Meng-Hung Lin; Hua-Chiang Wen; Yeau-Ren Jeng; Chang-Pin Chou

Book ID: 107470838
Publisher: Springer-Verlag
Year: 2010
Tongue: English
Weight: 301 KB
Volume: 5
Category: Article
ISSN: 1931-7573
DOI: 10.1007/s11671-010-9717-8

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