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Nanoindentation characterization of GaN epilayers on A-plane sapphire substrates

✍ Scribed by Meng-Hung Lin; Hua-Chiang Wen; Chih-Yung Huang; Yeau-Ren Jeng; Wei-Hung Yau; Wen-Fa Wu; Chang-Pin Chou

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 267 KB
Volume: 256
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2009.12.054

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