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Growth and Characterization of Thick Si-Doped AlGaN Epilayers on Sapphire Substrates

✍ Scribed by Lundin, W. V. ;Usikov, A. S. ;Sakharov, A. V. ;Tretyakov, V. V. ;Poloskin, D. V. ;Ledentsov, N. N. ;Hoffmann, A.

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 181 KB
Volume: 176
Category: Article
ISSN: 0031-8965
DOI: 10.1002/(sici)1521-396x(199911)176:1<379::aid-pssa379>3.0.co;2-v

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