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Growth and Characterization of High Quality Continuous GaN Films on Si-Doped Cracked GaN Templates

✍ Scribed by Chua, S.J. ;Hao, M. ;Zhang, J. ;Sia, E.K.

Publisher: John Wiley and Sons
Year: 2001
Tongue: English
Weight: 223 KB
Volume: 188
Category: Article
ISSN: 0031-8965
DOI: 10.1002/1521-396x(200111)188:1<421::aid-pssa421>3.0.co;2-4

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