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Modeling the behavior of amorphous oxide thin film transistors before and after bias stress

✍ Scribed by A. Cerdeira; M. Estrada; B.S. Soto-Cruz; B. Iñiguez


Book ID
119326649
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
353 KB
Volume
52
Category
Article
ISSN
0026-2714

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