✦ LIBER ✦
P-139L: Late-News Poster: AC Gate-Drain-Bias Stress Study of amorphous Indium Gallium Zinc Oxide Thin Film Transistors for GOA Applications
✍ Scribed by Chao-Yu Yang; Shih-Che Huang; Hao-Lin Chiu; Ting Hsieh; Bo-Liang Yeh; Ching Shun Lin; Ta-Wen Liao; Hsien-Kai Tseng; Chun Nan Lin; Wen Ching Tsai
- Book ID
- 115558248
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 2012
- Weight
- 252 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0003-966X
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