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Empirical Modeling and Extraction of Parasitic Resistance in Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors

✍ Scribed by Jun-Hyun Park; Hyun-Kwang Jung; Sungchul Kim; Sangwon Lee; Dong Myong Kim; Dae Hwan Kim

No coin nor oath required. For personal study only.

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