✦ LIBER ✦

Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors

✍ Scribed by Magali Estrada; Antonio Cerdeira; Benjamin Iñiguez

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Modeling the behavior of amorphous oxide

✍ A. Cerdeira; M. Estrada; B.S. Soto-Cruz; B. Iñiguez 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 353 KB

Back-bias effect on the current-voltage

✍ Y. Kaneko; K. Tsutsui; T. Tsukada 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 335 KB

Effects of the rear interface states and

✍ Ya-Hsiang Tai; Feng-Cheng Su; Ming-Shiang Feng; Huang-Chung Cheng 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 715 KB

The effects of metal-n+ interface and sp

✍ Gadelrab, S.M.; Chamberlain, S.G. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 275 KB

Influence of Carrier Mobility and Interf

✍ A. Bolognesi; A. Di Carlo 📂 Article 📅 2003 🏛 Springer 🌐 English ⚖ 97 KB

Effects of the rear interface states and

📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 144 KB