Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers

✍ Scribed by Ya-Hsiang Tai; Feng-Cheng Su; Ming-Shiang Feng; Huang-Chung Cheng

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 715 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(95)00271-5