Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers : Ya-Hsiang Tai et al. Solid-State Electronics, 39 (6), 901 (1996)

• Book ID: 108362312
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 144 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)87736-0