The effects of metal-n+ interface and space charge limited conduction on the performance of amorphous silicon thin-film transistors

✍ Scribed by Gadelrab, S.M.; Chamberlain, S.G.

• Book ID: 114535603
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 275 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.275240