Annealing behavior of metastable defects created by bias stress in hydrogenated amorphous silicon thin film transistors

✍ Scribed by Jeong Young Lee; Choonchon Lee; Jin Jang; Byung Seong Bae

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 250 KB
• Volume: 83
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(92)90037-a