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Modeling of direct tunneling current through gate dielectric stacks

✍ Scribed by Mudanai, S.; Yang-Yu Fan; Qiqing Ouyang; Tasch, A.F.; Banerjee, S.K.

Book ID: 114538292
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 182 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.870561

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