Investigation of the Correlation Between Temperature and Enhancement of Electron Tunneling Current Through Gate Stacks

✍ Scribed by Ling-Feng Mao

• Book ID: 114619105
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 521 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.914471