Modeling and estimation of edge direct tunneling current for nanoscale metal gate (Hf/AlNx) symmetric double gate MOSFET

✍ Scribed by S.K. Vishvakarma; V. Komal Kumar; A.K. Saxena; S. Dasgupta

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 471 KB
• Volume: 42
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/j.mejo.2011.02.008