✦ LIBER ✦
Investigation of hole-tunneling current through ultrathin oxynitride/oxide stack gate dielectrics in p-MOSFETs
✍ Scribed by Hongyu Yu; Yong-Tian Hou; Ming-Fu Li; Dim-Lee Kwong
- Book ID
- 114616765
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 302 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
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