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Modeling and characterization of gate oxide reliability

✍ Scribed by Lee, J.C.; Chen Ih-Chin; Hu Chenming

Book ID: 114538358
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 1013 KB
Volume: 35
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.8802

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