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Mobility and screening effect in heavily doped accumulation-mode metal-oxide-semiconductor field-effect transistors

✍ Scribed by Goto, Ken-Ichi; Yu, Tsung-Hsing; Wu, Jeff; Diaz, Carlos H.; Colinge, J. P.

Book ID: 118154346
Publisher: American Institute of Physics
Year: 2012
Tongue: English
Weight: 489 KB
Volume: 101
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4745604

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