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Mismatch of lateral field metal-oxide-metal capacitors in 180 nm CMOS process

✍ Scribed by Abusleme, A.; Dragone, A.; Haller, G.; Murmann, B.

Book ID: 120616756
Publisher: The Institution of Electrical Engineers
Year: 2012
Tongue: English
Weight: 313 KB
Volume: 48
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el.2011.3804

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