Effect of the discharging and recharging of the stress generated oxide charge in metal–oxide–semiconductor capacitors on the low field leakage current

✍ Scribed by A Meinertzhagen; C Petit; G Yard; M Jourdain; F Mondon

• Book ID: 108362206
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 264 KB
• Volume: 38
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)00034-6