The effect of gate material on oxide degradation due to charge-injection in metal-oxide-semiconductor capacitors

✍ Scribed by E. Avni; Y. Sonnenblick; Y. Nissan-Cohen

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 596 KB
• Volume: 31
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(88)90136-0