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Microstructure, residual stress, and fracture of sputtered TiN films

โœ Scribed by Zhang, Liqiang; Yang, Huisheng; Pang, Xiaolu; Gao, Kewei; Volinsky, Alex A.


Book ID
121333691
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
860 KB
Volume
224
Category
Article
ISSN
0257-8972

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