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Residual stress in coated low-z films of TiC and TiN: II. correlation of residual stress with microstructure

โœ Scribed by Isao Yoshizawa; Zensaburo Kabeya; Kohji Kamada


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
887 KB
Volume
123
Category
Article
ISSN
0022-3115

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