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Residual stress in coated low-Z films oF TiC and TiN: I. Stress measurement by use of X-ray diffractometry

✍ Scribed by Isao Yoshizawa; Kohji Kamada

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 461 KB
Volume: 123
Category: Article
ISSN: 0022-3115
DOI: 10.1016/0022-3115(84)90260-5

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